By Peter W. Hawkes
Advances in Imaging & Electron Physics merges long-running serials―Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The sequence good points prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, photograph technology and electronic photograph processing, electromagnetic wave propagation, electron microscopy, and the computing equipment utilized in a lot of these domains.
- Contributions from major specialists
- Informs and updates on the entire newest advancements within the field
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Additional info for Advances in imaging and electron physics. Volume 183
Walker Figure 14 Schematic of the AES experiments in the SEM. HFA ¼ hyperbolic ﬁeld analyzer; OL ¼ objective lens; ET ¼ Everhart-Thornley detector. The EDS detector is located behind and to the right of the objective lens. The sample (not shown) can be tilted from side to side to alternate between the position for Ar ion cleaning and the position for analysis. bombardment in order to collect a full spectrum. Such a long time in the SEM’s vacuum environment of 10-6 mbar results in the buildup of a layer of contaminants on the sample surface to be examined.
Physical Review Special Topics: Accelerators and Beams, 5, 124404. , & Rehak, P. (2005). Review of semiconductor drift detectors. Nuclear Instruments and Methods in Physics Research Section A, 541, 47–60. , & Rehak, P. (1983). Semiconductor drift chamberdAn application of a novel charge transport scheme. Nuclear Instruments and Methods in Physics Research Section A, 225, 608–621. , & Sakai, Y. (1994). True Auger spectral shapes: A step to standard spectra. Surface and Interface Analysis, 22, 75–78.
M. (1996). Transport equation approach to electron microbeam analysis. Fundamentals and applications, Microchimica Acta, supplement, 13, 13–38. Werner, W. S. , et al. (2005). Emission-depth-selective Auger photoelectron coincidence spectroscopy. Physical Review Letters, 94, 038302. 40 Mohamed M. El-Gomati and Christopher G. H. , El Gomati, M. , Wilkinson, D. , Chu, D. , & Dowsett, M. G. (1998). Mc3D: A three-dimensional Monte Carlo system simulating image contrast in surface analytical scanning electron microscopy.
Advances in imaging and electron physics. Volume 183 by Peter W. Hawkes